USA - Aehr Test Systems (www.aehr.com) has received an order for an additional FOX-1 system to a leading flash memory manufacturer.

"We are very pleased to have received this follow-on order for additional FOX-1 test capacity, which we believe to be an endorsement of the ongoing cost saving benefits that our customer achieves with our full wafer test solution," said Carl Buck, vice president of marketing at Aehr Test Systems.

"The FOX-1 system, using an Aehr Test Systems' WaferPak contactor, allows parallel testing of thousands of die on a 300mm wafer with only a single touchdown.

"This order reinforces our belief that the utilization of our worldwide installed base is reaching capacity levels in certain parts of the world for both our FOX wafer test and burn-in solutions as well as our ABTS line of packaged part test and burn-in systems," added Buck. "It is also a testament to the continued value provided by our FOX-1 system."

The FOX-1 full wafer parallel test system, a member of the FOX family of wafer level test and burn-in systems, is most effective for test and/or short test during burn-in applications. Other members of Aehr Test's FOX family of products are focused on long-duration full wafer burn-in and test of products such as automotive ICs, DRAMs and VCSELs (laser diodes).