Israel - Orbotech (www.orbotech.com) announces that Tianma Micro-electronics (“Tianma”) has selected Orbotech’s ArrayChecker and Automated Optical Inspection (AOI) solutions for its production line upgrade to flexible AMOLED technology.
Tianma has invested approximately $1.8 billion to extend its Gen 6 AMOLED fab in Wuhan, China. The Wuhan fab is designed for the production of flexible AMOLED display panels which are rapidly gaining popularity in consumer electronics devices. When the new line ramps up to mass production during the second half of 2017, Tianma expects to achieve capacity of 30,000 panels per month, with an additional 30,000 per month capacity increase in 2018.
According to the IHS Display Long-Term Demand Forecast Tracker Q4 2016, “AMOLED’s share of overall FPD revenue will increase to almost 30% in 2023. Revenue from AMOLED displays is expected to grow from $15 billion in 2016 to $36 billion in 2023 for a R of 17%.”
“We are delighted that Tianma has selected our solutions for their flex AMOLED fabrication line,” stated Mr. Edu Meytal, President of Orbotech Pacific Display. “These solutions, which were designed to enable the new manufacturing processes required to produce flex AMOLED displays, will enable our customers to produce the most advanced FPD products available with high yields. This deal builds upon past successful implementations of Orbotech’s inspection, testing and repair solutions.”
Orbotech’s FPD AOI systems offer display manufacturers cutting edge automated inspection solutions for all types of display technologies including Flexible AMOLED. Orbotech FPD AOI systems increase production yields using advanced optics for image acquisition, unique image processing technologies, algorithms and data processing capabilities, microscopic video imaging, CD/Overlay measurements and automated macro (Mura) inspection to enable high-sensitivity defect detection and extremely accurate classification.
The Orbotech ArrayChecker test system determines whether individual pixels or lines of pixels are functional. It also finds more subtle process defects such as variations in individual pixel voltage. Defect data are used for repair and statistical process control to decrease material costs and improve throughput.